トモグラフィー
アトムプローブ・トモグラフィーのワークフロー
1試料1チップ：当社のトモグラフィーホルダー・システムに加え、FIB、アトムプローブの組み合わせにより、原子スケール3D画象を再構成する包括的かつ相互相関的なデータを取得できます。試料はFIBで必要なサイズと形状に加工され、チップに取り付けられたままTEMにセットされます。TEMを使用して、最終的な形状の確認を傾斜系列取得で行った後、アトムプローブにセットして最終的な分析を行うことができます。
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アクセサリーについて
トモ グラフィホ ル ダー で 使 用 で きるアク セ サリー：
- 1mm 角グリッド
- 1mm L型グリッド
- 3mm タブ付きグリッド
- ハーフグリッド設置用治具
- フルグリッド設置用治具
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TEMトモグラフィーを用いたナノワイヤーの特性評価
ノースウェスタン大学の研究者らは、ハミングバード製のトモグラフィー・ホルダーを使用し、金触媒を用いたナノワイヤーの特性評価と、Siナノワイヤー上の金（Au）の空間分布マップを作成しました。Siナノワイヤー・デバイスに付着したAuナノ粒子は、ナノワイヤーの局所的な表面プラズモン励起によって、光電流を著しく増 大させました。このような材料におけるナノスケールの構造特性を完全に理解するためには、サブナノメートルの解像度を持つ3次元的な視点が必要です。
参考文献：J. Wu, S. Padalkar, S. Xie, E.R. Hemesath, J. Cheng, G. Liu, A. Yan, J.G. Connell, E. Nakazawa, X. Zhang, L.J. Lauhon, V.P. Dravid. “Electron Tomography of Au-Catalyzed Semiconductor Nanowires,” Journal of Physical Chemistry C 117:2 (2013) pp.1059-1063.
Copyright © 2012, American Chemical Society
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左図b,c：角度を付けたナノワイヤーの暗視野STEM像スケールバーは50 nm右図d：Siナノワイヤー上のAu粒子分布の3次元イメージの再構成 Tilt series Z-contrast STEM images of a Ge nanowire after alignment into a rotation projection, taken using Hummingbird Scientific’s Tomography holder. The nano-wire is approximately 150nm in diameter and it shows positioning of a gold nano-particle on the wire.
Reference: J. Wu, S. Padalkar, S. Xie, E.R. Hemesath, J. Cheng, G. Liu, A. Yan, J.G. Connell, E. Nakazawa, X. Zhang, L.J. Lauhon, V.P. Dravid. “Electron Tomography of Au-Catalyzed Semiconductor Nanowires,” Journal of Physical Chemistry C 117:2 (2013) pp.1059‒1063. Abstract
Copyright © 2012, American Chemical Society
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