Hummingbird Tomography TEM Sample Holder - Half Grid JEOL with 3d tomographic recontruction


Flexible Sample Transfer


TEM Sample Holder - Atom Probe Cross Correllative Tomography - FEI Model
1000 Series
Removable tips for varying  sample sizes
Single Point Needle, 1mm Grid, 3mm Half-Grid, 3mm Full-Grid
Tilt Range
±90° (dependent on stage limits)
Image Resolution Down to microscope spec
TEM Compatibility TFS/FEI, JEOL, Hitachi, Zeiss

* Call for Custom Configurations




ノースウェスタン大学の研究者らは、ハミングバード製のトモグラフィー・ホルダーを使用し、金触媒を用いたナノワイヤーの特性評価と、Siナノワイヤー上の金(Au)の空間分布マップを作成しました。Siナノワイヤー・デバイスに付着したAuナノ粒子は、ナノワイヤーの局所的な表面プラズモン励起によって、光電流を著しく増 大させました。このような材料におけるナノスケールの構造特性を完全に理解するためには、サブナノメートルの解像度を持つ3次元的な視点が必要です。

参考文献:J. Wu, S. Padalkar, S. Xie, E.R. Hemesath, J. Cheng, G. Liu, A. Yan, J.G. Connell, E. Nakazawa, X. Zhang, L.J. Lauhon, V.P. Dravid. “Electron Tomography of Au-Catalyzed Semiconductor Nanowires,” Journal of Physical Chemistry C 117:2 (2013) pp.1059-1063.

Copyright © 2012, American Chemical Society

左図b,c:角度を付けたナノワイヤーの暗視野STEM像スケールバーは50 nm右図d:Siナノワイヤー上のAu粒子分布の3次元イメージの再構成

Video Spotlight

Tilt series Z-contrast STEM images of a Ge nanowire after alignment into a rotation projection, taken using Hummingbird Scientific’s Tomography holder. The nano-wire is approximately 150nm in diameter and it shows positioning of a gold nano-particle on the wire.

Reference: J. Wu, S. Padalkar, S. Xie, E.R. Hemesath, J. Cheng, G. Liu, A. Yan, J.G. Connell, E. Nakazawa, X. Zhang, L.J. Lauhon, V.P. Dravid. “Electron Tomography of Au-Catalyzed Semiconductor Nanowires,” Journal of Physical Chemistry C 117:2 (2013) pp.1059‒1063. Abstract

Copyright © 2012, American Chemical Society

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