Hummingbird Scientific Electrical Biasing TEM Holder with wirebonded 6-pin chip

電気バイアス用ホルダー

技術仕様

TEM Sample Holder - Electrical Biasing - FEI Model
  1600 Series
Tilt Range ±45° depending on microscope and pole piece
Number of Electrical Contacts 6, 8, or 9 *
Contact Type Flexible wirebond contacts or fixed spring contact
Carrier Removable Sample Carrier
Carrier Compatibility Any Standard TEM Sample Supports
Sample Size Fits up to 3 x 6mm samples
Wiring Standard or low-noise shielded
TEM Compatibility TFS/FEI, JEOL, Hitachi, Zeiss

* Call for Custom Configurations

特徴

注目の研究

ナノスケールでの温度マッピング

マイクロエレクトロニクス・デバイスは、TEMの分析ツールボックスを活用し、電気バイアス用ホルダーを使用することで、観察とテストを同時に行うことが可能です。UCLAが率いるチームは、バルクの温度をプラズモンを用いてナノメートルの空間分解能で測定する、非接触温度測定技術を実証しています。

参考文献: B.C. Regan et al. Nanoscale temperature mapping in operating microelectronic devices(動作中のマイクロ電子デバイスにおけるナノスケール温度マッピング)サイエンス誌(2015年)Abstract

著作権 © 2016 by アメリカ科学振興会.

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Alデバイスのジュール加熱とEELSスペクトル。画像の著作権 © 2016 by the American Association for the Advancement of Science(アメリカ科学振興協会

Video Spotlight

Using our electrical biasing holder, researchers at Penn State have demonstrated the room temperature dislocation-based plasticity and tremendous flaw tolerance of TiN film, which in bulk form is a brittle material. TiN loading was conducted using a MEMS device containing electro-thermal actuators. The researchers surmise that room-temperature dislocation activities resulted from the nucleation of pre-existing dislocations, which resulted from residual compressive stresses developed during deposition. As a result, the TiN films were tougher than the Ti films in the tested multilayers. The movie shows the dislocation movement at the crack tip following loading at room temperature.

Reference: S. Kumar, D.E. Wolfe, M.A Haque. “Dislocation shielding and flaw tolerance in titanium nitride,” International Journal of Plasticity 27:5 (2011) pp. 739–747 . Abstract

Movie copyright © 2010, Elsevier Ltd.  All rights reserved.

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