| 1700 Series | |
| Tilt Range | Up to ±45° depending on objective pole |
| Sample Size |
1x2mm |
| In-plane applied magnetic flux density |
Up to 900 Gauss, depending on microscope and pole piece |
| Electron imaging |
From -300 Oe to +300 Oe applied field depending on microscope and pole piece |
| Beam Deflection |
Integrated passive magnetic compensation |
| TEM Compatibility | TFS/FEI, JEOL, Hitachi |
MagnetizingTechnical Specs
