MagnetizingTechnical Specs

1700 Series
Tilt Range Up to ±45° depending on objective pole
Sample Size
1x2mm
In-plane applied magnetic flux density
Up to 900 Gauss, depending on microscope and pole piece
Electron imaging
From -300 Oe to +300 Oe applied field depending on microscope and pole piece
Beam Deflection
Integrated passive magnetic compensation
TEM Compatibility TFS/FEI, JEOL, Hitachi

* Call for Custom Configurations