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![TEM Sample Holder - Electrical Biasing - FEI Model](https://hummingbirdscientific.co.jp/wp-content/uploads/TEM-Sample-Holder-Electrical-Biasing-FEI-Model.jpg)
1600 Series | |
Tilt Range | ±45° depending on microscope and pole piece |
Number of Electrical Contacts | 6, 8, or 9 * |
Contact Type | Flexible wirebond contacts or fixed spring contact |
Carrier | Removable Sample Carrier |
Carrier Compatibility | Any Standard TEM Sample Supports |
Sample Size | Fits up to 3 x 6mm samples |
Wiring | Standard or low-noise shielded |
TEM Compatibility | TFS/FEI, JEOL, Hitachi, Zeiss |
ナノスケールでの温度マッピング
マイクロエレクトロニクス・デバイスは、TEMの分析ツールボックスを活用し、電気バイアス用ホルダーを使用することで、観察とテストを同時に行うことが可能です。UCLAが率いるチームは、バルクの温度をプラズモンを用いてナノメートルの空間分解能で測定する、非接触温度測定技術を実証しています。
参考文献: B.C. Regan et al. Nanoscale temperature mapping in operating microelectronic devices(動作中のマイクロ電子デバイスにおけるナノスケール温度マッピング)サイエンス誌(2015年)Abstract
著作権 © 2016 by アメリカ科学振興会.
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Alデバイスのジュール加熱とEELSスペクトル。画像の著作権 © 2016 by the American Association for the Advancement of Science(アメリカ科学振興協会
Using our electrical biasing holder, researchers at Penn State have demonstrated the room temperature dislocation-based plasticity and tremendous flaw tolerance of TiN film, which in bulk form is a brittle material. TiN loading was conducted using a MEMS device containing electro-thermal actuators. The researchers surmise that room-temperature dislocation activities resulted from the nucleation of pre-existing dislocations, which resulted from residual compressive stresses developed during deposition. As a result, the TiN films were tougher than the Ti films in the tested multilayers. The movie shows the dislocation movement at the crack tip following loading at room temperature.
Reference: S. Kumar, D.E. Wolfe, M.A Haque. “Dislocation shielding and flaw tolerance in titanium nitride,” International Journal of Plasticity 27:5 (2011) pp. 739–747 . Abstract
Movie copyright © 2010, Elsevier Ltd. All rights reserved.
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